JPH0624779Y2 - 位相雑音測定装置 - Google Patents
位相雑音測定装置Info
- Publication number
- JPH0624779Y2 JPH0624779Y2 JP14321486U JP14321486U JPH0624779Y2 JP H0624779 Y2 JPH0624779 Y2 JP H0624779Y2 JP 14321486 U JP14321486 U JP 14321486U JP 14321486 U JP14321486 U JP 14321486U JP H0624779 Y2 JPH0624779 Y2 JP H0624779Y2
- Authority
- JP
- Japan
- Prior art keywords
- frequency
- signal
- phase noise
- local oscillator
- filter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14321486U JPH0624779Y2 (ja) | 1986-09-18 | 1986-09-18 | 位相雑音測定装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14321486U JPH0624779Y2 (ja) | 1986-09-18 | 1986-09-18 | 位相雑音測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6350068U JPS6350068U (en]) | 1988-04-05 |
JPH0624779Y2 true JPH0624779Y2 (ja) | 1994-06-29 |
Family
ID=31052683
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14321486U Expired - Lifetime JPH0624779Y2 (ja) | 1986-09-18 | 1986-09-18 | 位相雑音測定装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0624779Y2 (en]) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10090939B2 (en) | 2016-08-25 | 2018-10-02 | Infineon Technologies Ag | Integrated RF circuit with phase-noise test capability |
-
1986
- 1986-09-18 JP JP14321486U patent/JPH0624779Y2/ja not_active Expired - Lifetime
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10090939B2 (en) | 2016-08-25 | 2018-10-02 | Infineon Technologies Ag | Integrated RF circuit with phase-noise test capability |
US10205541B2 (en) | 2016-08-25 | 2019-02-12 | Infineon Technologies Ag | Integrated RF circuit with phase-noise test capability |
Also Published As
Publication number | Publication date |
---|---|
JPS6350068U (en]) | 1988-04-05 |
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